Iddq Testing for CMOS VLSI

Rating:
Summary: Quickly Written - No Meat
Review: This book discusses a few issues involved in IDDQ testing, theauthors research in bridging faults and some research done by Hawkins and Soden.Very little detail is given about On-Chip Current Sensors or the QTAG standard. Other topics like estimating Quiescent Current and fault modeling are only discussed briefly. This book was written as an attempt to get a book out quickly on a "hot" topic. Someone should write an in-depth book discussing all of the pressing IDDQ issues in detail without this "get to market" time constraint. The book however can introduce a novice reader to IDDQ but it is not for an intermediate or advanced engineer. If it was the intent of the author to write a book for novices he should have discussed more basic VLSI Design.